PhotoMetrics, Inc.
15801 Graham St.
Huntington Beach CA 92649
(714) 895-4465
Fax (714) 893-4682

e-mail: lab@photometrics.net


Wavelength Dispersive X-Ray Spectrometry (WDS)


WDS identifies the elemental composition of materials imaged in the SEM with an order of magnitude better spectral resolution, sensitivity and ability to determine concentratins of light elements than is achievable with EDS. Most elements are detected below 0.1% and some as low as a few ppm.

Applications include

Principle of Operation

The characteristic X-ray photons excited by the electron beam are sorted using a diffracting crystal, whose angular placement relative to the sample and photodetector is a unique measure of their wavelengths. As with EDS, the resulting spectral distribution is automatically compared with those from actual standards or synthetic X-ray fluorescence spectra of material formulations.

WDS vs. EDS

X-ray microanalysis in the scanning electron microscope is accomplished using EDS and/or WDS. EDS is more commonly applied due to its simplicity and speed, while WDS offers an important and often critical refinement of EDS data by providing


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