PhotoMetrics, Inc.
15801 Graham St.
Huntington Beach CA 92649
(714) 895-4465
Fax (714) 893-4682
e-mail: lab@photometrics.net

Analytical Techniques

Scanning Electron Microscopy (SEM)

SEM provides topographical and elemental informatin at useful magnifications of 10x to 100,000x with virtually unlimited depth of field. Field Emission Scanning Electron Microscopy (FESEM) and In-lens FESEM is also available for ultrahigh resolution imaging.

Energy Dispersive X-Ray Spectroscopy (EDS)

EDS identifies the elemental composition of materials imaged in an SEM for all atomic numbers greater than that of boron. Elements are typically detected at concentrations as low as 0.1%.

Atomic Force Microscopy and Scanning Probe Microscopy (AFM/SPM)

AFM provides topographical information down to the Angstrom level. A physical probe is raster scanned across the sample to produce a three dimensional image of the surface and a line profile with height measurements. Additional properties such as thermal conductivity, magnetic and electrical field strength and sample compliance on the nanometer scale can be simultaneously obtained using specialty probes.

Wavelength Dispersive X-Ray Spectrometry (WDS)

WDS identifies the elemental composition of materials imaged in an SEM with one or two orders of magnitude better threshold sensitivity and ability to determine concentrations of light elements than EDS. Most elements are detected below 0.1% and some as low as a few ppm.

Scanning Auger Microanalysis (SAM)

SAM provides elemental and chemical composition for all elements with an atomic number greater than that of helium. Its inherent sampling depth of 2-3 nm allows films as thin as a few monolayers to be analyzed. Auger maps the spatial distributions of elements and produces depth profiles of composition from 1 to 2000 nm.

Fourier Transform Infrared Spectroscopy (FTIR)

FTIR performs qualitative and quantitative analysis of organic compounds, and determines the chemical structure of many inorganics as well. The FTIR microscope accessory permits analysis of samples as small as a few microns in diameter.