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Because chemical bonds absorb infrared energy at specific frequencies (or wavelengths), the basic structure of compounds can be determined by the spectral locations of their IR absorptions. The plot of a compound's IR transmission vs. frequency is its "fingerprint", which when compared to reference spectra identifies the material. FTIR spectrometers offer speed and sensitivity impossible to achieve with earlier wavelength-dispersive instruments. This capability allows rapid analysis of micro-samples down to the nanogram level in some cases, making the FTIR unmatched as a problem-solving tool in organic analysis.
The FTIR microscope accessory (shown in the photo above) allows spectra from a few nanograms of material to be obtained quickly, with little sample preparation, resulting in more data at lower cost. In some cases, thin films of residue are identified with a sensitivity that rivals or even exceeds electron or ion beam-based surface analysis techniques.
There are few sample constraints; solids, liquids and gases can be accommodated. Many contaminants present on reflective surfaces such as solder pads or printed circuitry are readily analyzed in situ using the FTIR microscope in reflectance mode.
More information on infrared spectroscopy:
Theory of Infrared Spectroscopy: here and here,
Identifying organic structure by FTIR
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