PhotoMetrics, Inc.
15801 Graham St.
Huntington Beach CA 92649
(714) 895-4465
Fax (714) 893-4682

Atomic Force Microscope/Scanning Probe Microscopy

Atomic Force Microscopy and Scanning Probe Microscopy (AFM/SPM) provide topographic information down to the Angstrom level. Additional properties of the sample, such as thermal and electrical conductivity, magnetic and electric field strength, and sample compliance can simultaneously be obtained using a specialty probe. Many applications require little or no sample preparation.

Principle of Operation

The Atomic Force Microcope uses a physical probe raster scanning across the sample using piezoelectric ceramics. A feedback loop is used to maintain a constant interaction between the probe and the sample. The position of the probe and the feedback signal are electronically recorded to produce a three dimensional map of the surface or other information depending on the specialty probe used.

Data Output is either a three dimensional image of the surface or a line profile with height measurements. The surface roughness parameters of Ra or RMS are also available with either of the above outputs.

Other types of feature analysis include Partical Grain Size Analysis, Bearing Ratio, Fractal Dimension, Power Spectrum, and Fast Fourier Transform.

Applications include

Materials Evaluation:

Surface roughness on implanted silicon wafers
Thermal properties such as thermal conductivity, glass transition temperature (Tg), and melting temperature of various phases of a blended polymer measured down to the nanometer scale
Surface profiles and magnetic field mapping of recording media or reading heads
Nanomechanical testing

Failure Analysis

Rapid hot-spot analysis of powered electronic devices
Defect analysis of compact disk stampers

Quality Control

Surface profiles of thin film and coatings
Metrology of semiconductor devices and compact disks
Surface finish of substrates for thin film deposition

SPM Techniques

Magnetic Force Microscopy

Digital Video Disc Surface (10 microns)